Source: ISIJ International. Unidade: EP
ABNT
CAMPOS, Marcos Flávio de et al. Effect of the hot band grain size and intermediate annealing on the deformation and recrystallization textures in low silicon electrical steels. ISIJ International, v. 44, n. 3, p. 591-597, 2004Tradução . . Acesso em: 03 maio 2024.APA
Campos, M. F. de, Landgraf, F. J. G., Takanohashi, R., Chagas, F. C., Falleiros, I. G. S., Fronzaglia, G. C., & Kahn, H. (2004). Effect of the hot band grain size and intermediate annealing on the deformation and recrystallization textures in low silicon electrical steels. ISIJ International, 44( 3), 591-597.NLM
Campos MF de, Landgraf FJG, Takanohashi R, Chagas FC, Falleiros IGS, Fronzaglia GC, Kahn H. Effect of the hot band grain size and intermediate annealing on the deformation and recrystallization textures in low silicon electrical steels. ISIJ International. 2004 ; 44( 3): 591-597.[citado 2024 maio 03 ]Vancouver
Campos MF de, Landgraf FJG, Takanohashi R, Chagas FC, Falleiros IGS, Fronzaglia GC, Kahn H. Effect of the hot band grain size and intermediate annealing on the deformation and recrystallization textures in low silicon electrical steels. ISIJ International. 2004 ; 44( 3): 591-597.[citado 2024 maio 03 ]